X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 290.15
Details Ammonium acetate, magnesium acetate, sodium cacodylate, PEG 8000, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 290.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 30.19 α = 90
b = 30.19 β = 90
c = 39.44 γ = 120
Symmetry
Space Group P 64

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 2001-12-10
Diffraction Radiation
Monochromator Protocol
Triangular monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X11 0.8068 EMBL/DESY, Hamburg X11

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.1 10 94.72 -- -- -- -- -- 8308 4.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.1 1.15 95.79 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.1 10.0 -- 4.0 7900 7350 408 94.8 0.1325 0.1325 0.1325 0.1864 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.1 1.15 -- -- -- 0.177 -- -- 95.79
RMS Deviations
Key Refinement Restraint Deviation
s_zero_chiral_vol 0.0
s_anti_bump_dis_restr 0.015
s_similar_adp_cmpnt 0.046
s_angle_d 0.0
s_approx_iso_adps 0.0
s_non_zero_chiral_vol 0.0
s_rigid_bond_adp_cmpnt 0.005
s_similar_dist 0.07
s_bond_d 0.037
s_from_restr_planes 0.0028
Coordinate Error
Parameter Value
Number Disordered Residues 7.0
Occupancy Sum Hydrogen 81.0
Occupancy Sum Non Hydrogen 190.25
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 0
Nucleic Acid Atoms 120
Heterogen Atoms 55
Solvent Atoms 37

Software

Software
Software Name Purpose
MAR data collection
XDS data reduction
SHELX model building
SHELXL-97 refinement
MAR data reduction
XDS data scaling
SHELX phasing