X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.8
Temperature 293.0
Details 1.3M tri Na Citrate, 0.1M Tris, 15% ethylene glycol, pH 8.8, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 75.21 α = 90
b = 75.21 β = 90
c = 49.26 γ = 90
Symmetry
Space Group P 43

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD CUSTOM-MADE sagitally focusing monochromator, vertically focusing mirror 2001-05-15
Diffraction Radiation
Monochromator Protocol
Sagitally focusing Si(111) double crystal monochromator MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.979464, 0.953732, 1.03321 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.63 100 96.8 -- 0.075 -- 3.4 34646 33538 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.63 1.69 82.5 -- 0.595 1.2 -- 2828

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.7 74.54 -- 0.0 30435 27141 1422 93.85 -- 0.14735 0.14523 0.18838 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.792 -- 175 3631 0.212 0.256 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 15.249
Anisotropic B[1][1] -0.15
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.15
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.3
RMS Deviations
Key Refinement Restraint Deviation
r_gen_planes_refined 0.011
r_angle_refined_deg 1.941
r_chiral_restr 0.143
r_gen_planes_other 0.009
r_symmetry_vdw_refined 0.3
r_symmetry_hbond_refined 0.142
r_nbtor_other 0.098
r_xyhbond_nbd_refined 0.196
r_mcbond_it 1.107
r_bond_other_d 0.003
r_angle_other_deg 2.329
r_mcangle_it 1.791
r_dihedral_angle_3_deg 19.565
r_symmetry_vdw_other 0.293
r_nbd_refined 0.286
r_nbd_other 0.268
r_scbond_it 2.65
r_bond_refined_d 0.022
r_dihedral_angle_1_deg 6.629
r_scangle_it 3.961
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1996
Nucleic Acid Atoms 0
Heterogen Atoms 14
Solvent Atoms 238

Software

Software
Software Name Purpose
d*TREK data scaling
dtDisplay data collection
HKL-2000 data reduction
CNS refinement
REFMAC refinement version: 5.1.05
d*TREK data reduction
DTDISPLAY data reduction
HKL-2000 data scaling
CNS phasing