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X-RAY DIFFRACTION
Materials and Methods page
1M14
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 292.0
    Details tartrate, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 146.8 α = 90
    b = 146.8 β = 90
    c = 146.8 γ = 90
     
    Space Group
    Space Group Name:    I 2 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type CUSTOM-MADE
    Collection Date 2001-12-20
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 1.008
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.6
    Resolution(Low) 50
    Number Reflections(All) 16183
    Number Reflections(Observed) 16183
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.108
    B(Isotropic) From Wilson Plot 79.3
    Redundancy 15.3
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.69
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.964
    Mean I Over Sigma(Observed) 1.8
    R-Sym I(Observed) 0.964
    Redundancy 10.5
    Number Unique Reflections(All) 1635
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 50.0
    Cut-off Sigma(F) 0.2
    Number of Reflections(all) 16183
    Number of Reflections(Observed) 16165
    Number of Reflections(R-Free) 679
    Percent Reflections(Observed) 99.0
    R-Factor(All) 0.2398
    R-Factor(Observed) 0.2397
    R-Work 0.238
    R-Free 0.286
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 58.7
    Anisotropic B[1][1] 1.57
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.57
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.57
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.69
    Number of Reflections(R-Free) 55
    Number of Reflections(R-Work) 1398
    R-Factor(R-Work) 0.454
    R-Factor(R-Free) 0.553
    R-Free Error 0.072
    Percent Reflections(Observed) 90.7
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_scangle_it 9.26
    x_scbond_it 6.89
    x_mcangle_it 7.82
    x_mcbond_it 5.72
    x_improper_angle_d 1.37
    x_dihedral_angle_d 23.7
    x_angle_deg 1.4
    x_bond_d 0.01
     
    Coordinate Error
    Luzzati ESD(Observed) 0.36
    Luzzati Sigma A(Observed) 0.32
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.43
    Luzzati Sigma A(R-Free Set) 0.38
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2452
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 17
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) CCP4 (TRUNCATE)
    Structure Solution AMORE
    Structure Refinement X-PLOR 98.1
     
    Software
    refinement X-PLOR(ONLINE) version: 98.1
    model building AMoRE
    data reduction TRUNCATE
    data collection HKL-2000