X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 291.0
Details ADA, manganese chloride, ammonium sulfate, MPD, glycerol, PEG 4000, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 52.74 α = 90
b = 149.48 β = 90
c = 79.53 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C 1.15 NSLS X8C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.32 50 98.4 -- -- -- -- 72904 72904 0.0 0.0 18.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.32 1.38 99.3 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.32 20.0 -- 2.0 74031 65709 6678 -- 0.191 0.189 0.184 0.2 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.32 1.38 8108 800 7308 0.266 0.287 0.01 88.7
X Ray Diffraction 1.38 1.45 8518 868 7650 0.23 0.24 0.008 92.6
X Ray Diffraction 1.45 1.54 8727 850 7877 0.206 0.235 0.008 94.9
X Ray Diffraction 1.54 1.66 8876 910 7966 0.193 0.214 0.007 96.3
X Ray Diffraction 1.66 1.83 8985 923 8062 0.184 0.203 0.007 97.5
X Ray Diffraction 1.83 2.09 9055 912 8143 0.185 0.201 0.007 97.6
X Ray Diffraction 2.09 2.64 9049 931 8118 0.188 0.206 0.007 97.1
X Ray Diffraction 2.64 19.79 9022 932 8090 0.201 0.209 0.007 94.2
RMS Deviations
Key Refinement Restraint Deviation
x_torsion_impr_deg 1.32
x_torsion_deg 24.7
x_angle_deg 2.3
x_bond_d 0.02
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.14
Luzzati Sigma A (Observed) 0.12
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.15
Luzzati Sigma A (R-Free Set) 0.13
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2147
Nucleic Acid Atoms 0
Heterogen Atoms 58
Solvent Atoms 388

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
CNS Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.1 refinement