X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 291.0
Details ADA, manganese chloride, ammonium sulfate, MPD, glycerol, PEG 4000, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 52.81 α = 90
b = 149.58 β = 90
c = 79.97 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C 1.15 NSLS X8C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.35 50 62953.0 -- -- -- -- 66876 66876 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.35 1.41 69.5 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.35 20.0 -- 2.0 66876 62953 6420 -- 0.184 0.182 0.179 0.2 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.35 1.41 5842 603 5239 0.206 0.236 0.01 67.6
X Ray Diffraction 1.41 1.49 7800 775 7025 0.194 0.216 0.008 90.2
X Ray Diffraction 1.49 1.58 8446 873 7573 0.176 0.191 0.006 97.4
X Ray Diffraction 1.58 1.7 8577 875 7702 0.169 0.183 0.006 98.5
X Ray Diffraction 1.7 1.87 8588 872 7716 0.17 0.188 0.006 99.0
X Ray Diffraction 1.87 2.14 8671 884 7787 0.176 0.197 0.007 99.3
X Ray Diffraction 2.14 2.7 8733 918 7815 0.184 0.194 0.006 99.6
X Ray Diffraction 2.7 19.99 8943 867 8076 0.205 0.225 0.008 98.8
RMS Deviations
Key Refinement Restraint Deviation
x_torsion_impr_deg 1.19
x_torsion_deg 24.5
x_angle_deg 2.7
x_bond_d 0.02
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.13
Luzzati Sigma A (Observed) 0.05
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.14
Luzzati Sigma A (R-Free Set) 0.08
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2157
Nucleic Acid Atoms 0
Heterogen Atoms 59
Solvent Atoms 394

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
CNS Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.1 refinement