X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 21.0
Details ammonium phosphate, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 21K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 152.71 α = 90
b = 152.71 β = 90
c = 93.42 γ = 90
Symmetry
Space Group I 41 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH bent silicon crystal 2000-06-05
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.0 APS 17-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 22.4 97.9 0.048 0.048 -- 15.8 15429 15108 -- 1.0 67.547
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.8 99.5 0.4 0.4 3.5 15.4 1846

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIRAS 2.7 19.92 -- 0.0 15429 15108 1086 97.9 0.247 0.247 0.245 0.264 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7 2.87 -- 172 2120 0.365 0.414 0.032 90.4
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 71.2
Anisotropic B[1][1] -17.99
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -17.99
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 35.98
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 4.05
c_scbond_it 2.67
c_mcangle_it 2.3
c_mcbond_it 1.31
c_improper_angle_d 1.1
c_dihedral_angle_d 21.2
c_angle_deg 1.6
c_bond_d 0.01
Coordinate Error
Parameter Value
Luzzati ESD (R-Free Set) 0.46
Luzzati Sigma A (R-Free Set) 0.59
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1774
Nucleic Acid Atoms 0
Heterogen Atoms 18
Solvent Atoms 14

Software

Computing
Computing Package Purpose
MAR Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHARP Structure Solution
CNS 2000 Structure Refinement
Software
Software Name Purpose
CNS version: 2000 refinement
SHARP model building
HKL2000 data reduction
MAR data collection