X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
pH 7
Temperature 295.0
Details PEG3350, sodium chloride, calcium chloride, tris-HCl, iso-propanol, pH 7.0, VAPOR DIFFUSION, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 50.92 α = 90
b = 83.3 β = 94.18
c = 91.24 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH 58 cm long, Pt-coated, fused silica, vertical focus mirror; Cyclindrically bent triangular Si(111) asymmetric cut, horizontal focus monochromator 2001-01-21
Diffraction Radiation
Monochromator Protocol
horizontal focus monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.08000 SSRL BL7-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 20 0.951 -- 0.055 -- 7.8 -- 37147 2.0 1.0 44.144
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.38 1.0 -- 0.646 2.5 7.0 3377

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.3 20.0 -- 2.0 33855 32181 1640 100.0 0.23 0.2185 0.217 0.258 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3 2.44 -- 227 4279 0.346 0.409 0.027 80.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model OVERALL ANISOTROPIC
Mean Isotropic B 65.2
Anisotropic B[1][1] 18.27
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -21.85
Anisotropic B[2][2] -9.41
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -8.87
RMS Deviations
Key Refinement Restraint Deviation
c_scbond_it 5.82
c_scangle_it 8.37
c_angle_deg 1.3
c_dihedral_angle_d 19.2
c_bond_d 0.008
c_mcbond_it 4.01
c_mcangle_it 6.22
c_improper_angle_d 1.14
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.33
Luzzati Sigma A (Observed) 0.44
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.42
Luzzati Sigma A (R-Free Set) 0.51
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3365
Nucleic Acid Atoms 1300
Heterogen Atoms 0
Solvent Atoms 244

Software

Software
Software Name Purpose
SOLVE phasing
CNS refinement
DENZO data reduction
SCALEPACK data scaling