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X-RAY DIFFRACTION
Materials and Methods page
1LPH
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.62 α = 90
    b = 79.62 β = 90
    c = 37.78 γ = 120
     
    Space Group
    Space Group Name:    H 3
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IIC
    Collection Date 1994-06-09
     
    Diffraction Radiation
     
    Diffraction Source
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 38.5
    Number Reflections(Observed) 3910
    Percent Possible(Observed) 83.4
    R Merge I(Observed) 0.06
    Redundancy 5.0
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.3
    Resolution(Low) 8.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 3548
    Percent Reflections(Observed) 75.7
    R-Factor(Observed) 0.161
    R-Work 0.161
     
    Temperature Factor Modeling
    Mean Isotropic B Value 37.3
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_scangle_it 2.547
    x_scbond_it 1.555
    x_mcangle_it 3.387
    x_mcbond_it 2.156
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 795
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 59
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) RIGAKU
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1, PROLSQ
     
    Software
    refinement PROLSQ
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1
    data collection RIGAKU