X-RAY DIFFRACTION Experimental Data & Validation

X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Details PEG 300, NACL, MGCL2, TRIS HCL, pH 7.50, VAPOR DIFFUSION, SITTING DROP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 102.39 α = 90
b = 65.96 β = 105.97
c = 78.15 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD CUSTOM-MADE -- 2001-03-11
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID -- APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.46 50 97.2 0.081 -- -- 4.0 84902 84902 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.46 1.51 81.0 0.475 -- 2.0 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.46 27.0 -- -- -- 84750 4244 -- -- 0.14869 0.14869 0.19072 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.46 1.532 -- 535 9643 0.172 0.257 -- --
X Ray Diffraction 1.532 1.613 -- 529 9717 0.129 0.224 -- --
X Ray Diffraction 1.613 1.701 -- 457 9092 0.105 0.204 -- --
X Ray Diffraction 1.701 1.801 -- 398 8139 0.094 0.186 -- --
X Ray Diffraction 1.801 1.912 -- 372 7213 0.089 0.18 -- --
X Ray Diffraction 1.912 2.038 -- 322 6417 0.094 0.159 -- --
X Ray Diffraction 2.038 2.183 -- 325 5592 0.098 0.167 -- --
X Ray Diffraction 2.183 2.349 -- 268 4840 0.103 0.156 -- --
X Ray Diffraction 2.349 2.542 -- 208 4200 0.105 0.168 -- --
X Ray Diffraction 2.542 2.77 -- 192 3549 0.121 0.161 -- --
X Ray Diffraction 2.77 3.043 -- 139 2982 0.141 0.178 -- --
X Ray Diffraction 3.043 3.376 -- 132 2454 0.157 0.173 -- --
X Ray Diffraction 3.376 3.791 -- 114 1975 0.169 0.161 -- --
X Ray Diffraction 3.791 4.321 -- 79 1540 0.209 0.172 -- --
X Ray Diffraction 4.321 5.025 -- 65 1150 0.236 0.192 -- --
X Ray Diffraction 5.025 6.002 -- 41 865 0.325 0.358 -- --
X Ray Diffraction 6.002 7.45 -- 38 573 0.407 0.412 -- --
X Ray Diffraction 7.45 9.821 -- 25 330 0.53 0.428 -- --
X Ray Diffraction 9.821 14.403 -- 4 170 0.538 0.748 -- --
X Ray Diffraction 14.403 27.0 -- 1 65 0.801 0.783 -- --
RMS Deviations
Key Refinement Restraint Deviation
p_angle_d 0.04
p_scbond_it 2.48
p_mcangle_it 1.6
p_mcbond_it 1.06
p_scangle_it 3.44
p_bond_d 0.02
p_chiral_restr 0.16
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4098
Nucleic Acid Atoms 0
Heterogen Atoms 225
Solvent Atoms 570

Software

Software
Software Name Purpose
DENZO data reduction
SCALEPACK data scaling
REFMAC refinement version: 4.0