X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 3.6
Temperature 293.0
Details ammonium sulphate, lithium sulphate, sodium sulphate, pH 3.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 58.42 α = 90
b = 58.42 β = 90
c = 32.08 γ = 120
Symmetry
Space Group P 6

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1999-04-20
CCD MARRESEARCH -- 1999-04-29
Diffraction Radiation
Monochromator Protocol
Ni MIRROR + Ni FILTER SINGLE WAVELENGTH
Si 111 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE BM14 1 ESRF BM14
ROTATING ANODE ELLIOTT GX-21 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 27.1 97.6 0.051 0.051 -- 2.7 4522 4522 0.0 0.0 18.567
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.95 2.06 90.9 0.173 0.173 4.2 2.0 598

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIRAS 1.95 27.1 -- 0.0 4681 4521 226 96.6 0.195 0.195 0.194 0.211 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.95 2.07 708 38 670 0.199 0.294 0.048 91.5
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model ISOTROPIC
Mean Isotropic B 25.0
Anisotropic B[1][1] -5.74
Anisotropic B[1][2] -1.46
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -5.74
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 11.48
RMS Deviations
Key Refinement Restraint Deviation
c_mcangle_it 3.363
c_dihedral_angle_d 25.4785
c_angle_deg 1.32164
c_bond_d 0.005357
c_scangle_it 4.729
c_improper_angle_d 0.72657
c_scbond_it 3.077
c_mcbond_it 2.255
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.2
Luzzati Sigma A (Observed) 0.11
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.24
Luzzati Sigma A (R-Free Set) 0.24
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 578
Nucleic Acid Atoms 0
Heterogen Atoms 13
Solvent Atoms 33

Software

Computing
Computing Package Purpose
MAR Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
SHARP Structure Solution
CNS Structure Refinement
Software
Software Name Purpose
CNS refinement
SHARP model building