X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4
Temperature 274.0
Details PEG 4000, sodium citrate, pH 4.0, VAPOR DIFFUSION, HANGING DROP, temperature 274K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 42.45 α = 90
b = 58.99 β = 90
c = 72.05 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 94
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC -- 1999-06-26
Diffraction Radiation
Monochromator Protocol
High resolution pass with 0.6 degree osc. Low resolution pass with 1.5 degree osc. SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.0 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.2 50 92.2 0.043 -- -- -- 57166 53030 3.0 1.5 9.5
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.2 1.24 63.3 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIRAS 1.2 36.03 -- 0.0 -- 46632 4673 81.2 -- 0.223 0.223 0.229 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.2 1.28 -- 434 3741 0.321 0.308 0.015 44.3
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 14.8
Anisotropic B[1][1] -0.31
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.2
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.11
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.004
c_scbond_it 1.87
c_angle_deg 1.1
c_improper_angle_d 0.67
c_mcangle_it 1.82
c_scangle_it 2.73
c_dihedral_angle_d 26.3
c_mcbond_it 1.23
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.16
Luzzati Sigma A (Observed) 0.16
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.16
Luzzati Sigma A (R-Free Set) 0.15
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1271
Nucleic Acid Atoms 0
Heterogen Atoms 13
Solvent Atoms 186

Software

Software
Software Name Purpose
HKL-2000 data collection
HKL-2000 data reduction
SOLVE phasing
RESOLVE model building
CNS refinement version: 1.1
HKL-2000 data scaling
RESOLVE phasing