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X-RAY DIFFRACTION
Materials and Methods page
1LDG
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.2 α = 90
    b = 86.8 β = 90
    c = 90.7 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MARRESEARCH
    Collection Date 1996-05-29
     
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type SRS BEAMLINE PX7.2
    Wavelength 1.488
    Site SRS
    Beamline PX7.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.74
    Resolution(Low) 20
    Number Reflections(Observed) 32471
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.066
    Redundancy 3.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.74
    Resolution(Low) 20.0
    Number of Reflections(Observed) 32471
    Percent Reflections(Observed) 99.6
    R-Factor(Observed) 0.197
    R-Work 0.197
    R-Free 0.235
     
    Temperature Factor Modeling
    Mean Isotropic B Value 11.0
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2384
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 220
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1