X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 78.9 α = 90
b = 78.9 β = 90
c = 229.7 γ = 120
Symmetry
Space Group P 61 2 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS -- 1994-08-18
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.43 58.8 55.0 0.098 -- -- 1.818 -- 9305 -- 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.5 15.0 -- 1.9 -- 9061 -- 58.5 -- 0.204 0.204 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 12.9
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.72
x_bond_d 0.024
x_angle_deg 4.56
x_dihedral_angle_d 26.9
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2590
Nucleic Acid Atoms 0
Heterogen Atoms 53
Solvent Atoms 30

Software

Computing
Computing Package Purpose
R-AXIS Data Reduction (intensity integration)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building