X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 292.0
Details PEG 4000, lauryl-dimethylamine-N-oxide, heptane-1,2,3-triol, tricine buffer, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 292K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.93 α = 90
b = 80.31 β = 92.41
c = 246.57 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH Flat mirror (vertical focusing) 2000-06-10
Diffraction Radiation
Monochromator Protocol
single crystal Si(311) bent monochromator (horizontal focusing) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 0.98 SSRL BL9-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.25 49.32 98.9 -- 0.119 -- 7.3 47751 47751 0.0 0.0 64.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.25 3.43 98.7 -- 0.45 1.7 7.4 6920

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.25 49.32 0.0 0.0 47695 47695 2385 98.5 0.263 0.263 0.248 0.287 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.25 3.37 4737 226 -- 0.328 0.373 -- 98.4
X Ray Diffraction 3.37 3.5 4746 241 -- 0.291 0.31 -- 98.5
X Ray Diffraction 3.5 3.66 4697 255 -- 0.279 0.324 -- 98.5
X Ray Diffraction 3.66 3.85 4735 239 -- 0.243 0.286 -- 98.3
X Ray Diffraction 3.85 4.09 4756 228 -- 0.24 0.32 -- 98.6
X Ray Diffraction 4.09 4.41 4732 229 -- 0.218 0.247 -- 98.4
X Ray Diffraction 4.41 4.85 4790 257 -- 0.208 0.247 -- 98.5
X Ray Diffraction 4.85 5.56 4777 234 -- 0.236 0.289 -- 98.5
X Ray Diffraction 5.56 7.0 4804 240 -- 0.233 0.28 -- 98.5
X Ray Diffraction 7.0 50.0 4921 236 -- 0.262 0.28 -- 98.4
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model isotropic
Mean Isotropic B 74.9
Anisotropic B[1][1] 46.477
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -11.191
Anisotropic B[2][2] -21.432
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -25.045
RMS Deviations
Key Refinement Restraint Deviation
c_dihedral_angle_d 19.25
c_angle_d 1.28
c_bond_d 0.00773
c_improper_angle_d 0.883
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.42
Luzzati Sigma A (Observed) 0.56
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.5
Luzzati Sigma A (R-Free Set) 0.6
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 14404
Nucleic Acid Atoms 0
Heterogen Atoms 964
Solvent Atoms 129

Software

Software
Software Name Purpose
CNS refinement
MOSFLM data reduction
CCP4 data scaling version: (SCALA)
CNS phasing