X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.4
Temperature 298.0
Details 10% PEG 8000, 0.2 M magnesium acetate, 0.1 M cacodylate, pH 6.4, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 111.26 α = 90
b = 111.26 β = 90
c = 65.64 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2001-02-06
CCD ADSC QUANTUM 4 -- 2001-02-06
Diffraction Radiation
Monochromator Protocol
Graphite --
Graphite MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.100 APS 19-ID
SYNCHROTRON APS BEAMLINE 19-ID 1.0715,1.0718,1.0534 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.32 30 99.7 0.073 -- -- -- 7127 6979 0.0 -3.0 68.14
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.32 3.42 100.0 0.37 -- 3.7 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD and Molecular Replacement 3.32 15.0 -- 0.0 6898 6898 754 -- 0.297 0.297 0.295 0.329 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.32 3.45 676 70 -- 0.456 0.577 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 2.325
x_bond_d 0.011
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.581
Luzzati Sigma A (Observed) 0.998
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.672
Luzzati Sigma A (R-Free Set) 1.124
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1609
Nucleic Acid Atoms 0
Heterogen Atoms 81
Solvent Atoms 26

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
MLPHARE, AMORE Structure Solution
X-PLOR 3.851 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.851 refinement
AMoRE model building
MLPHARE model building
HKL2000 data reduction
HKL2000 data collection