X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 293.0
Details MPD, B-Octyl Glucoside, CoCl2, NiCl2, Cobalt Hexamine Chloride, LiCl, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 114.4 α = 90.7
b = 115.9 β = 96.2
c = 126.6 γ = 93.5
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 123
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS X1000 Graphite Monochromator 1993-08-08
Diffraction Radiation
Monochromator Protocol
Graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 38 88.0 0.059 0.059 -- 2.3 286685 253428 2.0 2.0 26.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.4 79.0 0.099 0.099 5.1 1.9 32195

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIRAS 2.3 8.0 2.0 2.0 286685 253428 25342 88.0 -- -- 0.198 0.238 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3 2.4 32195 3220 -- 0.247 0.289 0.0 79.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Isotropic
Mean Isotropic B 29.2
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.0
c_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 18835
Nucleic Acid Atoms 0
Heterogen Atoms 1260
Solvent Atoms 1011

Software

Software
Software Name Purpose
Siemens data collection
XDS data reduction
SOLVE phasing
CNS refinement
SIEMENS data reduction
XDS data scaling