X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 298.0
Details NaAc, NaCl, EDTA, DTT, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 51.2 α = 90
b = 58.41 β = 90
c = 62.86 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 110
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 2000-03-09
Diffraction Radiation
Monochromator Protocol
single crystal Si(311) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 0.98 SSRL BL9-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.09 42.64 93.3 0.102 -- -- 5.5 79223 79223 -3.0 -3.0 6.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.09 1.11 61.8 0.717 -- 1.1 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.09 6.0 -- 0.0 73360 73360 2251 93.3 0.152 0.152 0.1506 0.1885 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.09 1.15 7942 -- -- 0.27 -- -- 68.91
X Ray Diffraction 1.15 1.23 10790 -- -- 0.27 -- -- 88.44
X Ray Diffraction 1.23 1.33 11222 -- -- 0.27 -- -- 98.18
X Ray Diffraction 1.33 1.48 11878 -- -- 0.27 -- -- 99.89
X Ray Diffraction 1.48 1.73 11827 -- -- 0.27 -- -- 100.0
X Ray Diffraction 1.73 6.0 19702 -- -- 0.27 -- -- 99.88
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 12.9
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.113
s_similar_dist 0.0
s_rigid_bond_adp_cmpnt 0.006
s_zero_chiral_vol 0.079
s_non_zero_chiral_vol 0.084
s_angle_d 0.035
s_from_restr_planes 0.0301
s_anti_bump_dis_restr 0.047
s_bond_d 0.016
s_similar_adp_cmpnt 0.075
Coordinate Error
Parameter Value
Number Disordered Residues 12.0
Occupancy Sum Hydrogen 1506.94
Occupancy Sum Non Hydrogen 1771.55
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1508
Nucleic Acid Atoms 0
Heterogen Atoms 66
Solvent Atoms 223

Software

Software
Software Name Purpose
AMoRE phasing
SHELXL-97 refinement
DENZO data reduction
SCALEPACK data scaling