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X-RAY DIFFRACTION
Materials and Methods page
1KXW
  •   Crystallization Hide
    Crystallization Experiments
    pH 4.7
    Details 50 MM ACETATE AT PH 4.7 CONTAINING 0.9 M NACL
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.16 α = 90
    b = 79.16 β = 90
    c = 37.88 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 295
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IIC
    Collection Date 1900-01-01
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL SI(111)
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.96
    Resolution(Low) 100
    Number Reflections(Observed) 8613
    Percent Possible(Observed) 93.8
    R Merge I(Observed) 0.047
     
    High Resolution Shell Details
    Resolution(High) 1.96
    Resolution(Low) 2.02
    Percent Possible(All) 88.2
    R Merge I(Observed) 0.183
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.96
    Resolution(Low) 6.0
    Cut-off Sigma(F) 1.0
    Number of Reflections(Observed) 8238
    Percent Reflections(Observed) 93.0
    R-Factor(Observed) 0.168
    R-Work 0.168
     
    Temperature Factor Modeling
    Data Not Available
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1001
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 59
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) PROCESS
    Data Reduction (data scaling) PROCESS (SCALE)
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1
    data reduction PROCESS version: (SCALE)
    data collection PROCESS