X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6
Temperature 298.0
Details 32% PEG1000, 0.1M MES, 10microM ZnCl2, pH 6.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 41.8 α = 92.8
b = 44.2 β = 95.3
c = 58.5 γ = 98
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 298
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS Ni-filtered 1997-11-01
Diffraction Radiation
Monochromator Protocol
graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE SIEMENS 1.542 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 29 75.0 0.092 0.092 -- 1.9 15937 15937 0.0 2.0 20.6
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.66 56.0 0.23 0.23 2.5 1.9 1400

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.5 29.07 0.0 0.0 10526 10526 1082 73.7 0.152 0.152 0.152 0.222 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.66 -- 131 1262 0.22 0.294 0.026 58.6
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 25.7
Anisotropic B[1][1] 0.72
Anisotropic B[1][2] -0.67
Anisotropic B[1][3] 0.66
Anisotropic B[2][2] -2.77
Anisotropic B[2][3] 1.89
Anisotropic B[3][3] 2.05
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 5.65
c_scbond_it 4.11
c_mcangle_it 3.86
c_mcbond_it 2.54
c_improper_angle_d 1.17
c_dihedral_angle_d 25.1
c_angle_deg 2.0
c_bond_d 0.016
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.21
Luzzati Sigma A (Observed) 0.25
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.31
Luzzati Sigma A (R-Free Set) 0.36
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3484
Nucleic Acid Atoms 0
Heterogen Atoms 52
Solvent Atoms 40

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (intensity integration)
XENGEN Data Reduction (data scaling)
AMORE Structure Solution
CNX 2000.1 Structure Refinement
Software
Software Name Purpose
CNX version: 2000.1 refinement
AMoRE model building
XENGEN data reduction
XENGEN data collection