X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6
Temperature 298.0
Details 32% PEG1000, 0.1M MES, 10microM ZnCl2, pH 6.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 41.8 α = 92.8
b = 44.2 β = 95.3
c = 58.5 γ = 98
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 298
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS Ni-filtered 1997-11-01
Diffraction Radiation
Monochromator Protocol
graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE SIEMENS 1.542 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 29 75.0 0.092 0.092 -- 1.9 15937 15937 0.0 2.0 20.6
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.66 56.0 0.23 0.23 2.5 1.9 1400

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.5 29.07 0.0 0.0 10526 10526 1082 73.7 0.152 0.152 0.152 0.222 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.66 -- 131 1262 0.22 0.294 0.026 58.6
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 25.7
Anisotropic B[1][1] 0.72
Anisotropic B[1][2] -0.67
Anisotropic B[1][3] 0.66
Anisotropic B[2][2] -2.77
Anisotropic B[2][3] 1.89
Anisotropic B[3][3] 2.05
RMS Deviations
Key Refinement Restraint Deviation
c_mcangle_it 3.86
c_mcbond_it 2.54
c_scangle_it 5.65
c_scbond_it 4.11
c_dihedral_angle_d 25.1
c_improper_angle_d 1.17
c_bond_d 0.016
c_angle_deg 2.0
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.21
Luzzati Sigma A (Observed) 0.25
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.31
Luzzati Sigma A (R-Free Set) 0.36
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3484
Nucleic Acid Atoms 0
Heterogen Atoms 52
Solvent Atoms 40

Software

Software
Software Name Purpose
XENGEN data collection
XENGEN data reduction
AMoRE phasing
CNX refinement version: 2000.1
XENGEN data scaling