X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Microgravity/vapor Diffusion
pH 8.5
Temperature 298.0
Details 25% PEG 400, 0.05M Tris, 0.05M MgCl2, 0.005M NaAD, 0.0025M ATP, pH 8.5, microgravity/vapor diffusion at 298K, microgravity/vapor diffusion

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 52.28 α = 90
b = 84.79 β = 110.5
c = 59.64 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 120
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1998-08-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X11 0.9050 EMBL/DESY, Hamburg X11

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.03 30 96.7 0.048 -- -- 3.4 239033 231200 -- -1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.028 1.08 72.3 0.381 -- 2.4 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.03 10.0 -- 4.0 216026 179414 10811 83.0 0.1077 0.1063 0.1063 0.1354 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.03 1.08 22308 -- -- 0.221 -- -- --
RMS Deviations
Key Refinement Restraint Deviation
s_bond_d 0.015
s_non_zero_chiral_vol 0.089
s_zero_chiral_vol 0.083
s_from_restr_planes 0.0282
s_anti_bump_dis_restr 0.149
s_angle_d 0.031
s_similar_adp_cmpnt 0.039
s_rigid_bond_adp_cmpnt 0.007
s_approx_iso_adps 0.068
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.05
Number Disordered Residues 18.0
Occupancy Sum Hydrogen 4272.09
Occupancy Sum Non Hydrogen 5072.19
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4264
Nucleic Acid Atoms 0
Heterogen Atoms 195
Solvent Atoms 714

Software

Software
Software Name Purpose
DENZO data reduction
SCALEPACK data scaling
SHELXL-97 refinement