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X-RAY DIFFRACTION
Materials and Methods page
1KNU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 294.0
    Details CITRIC ACID, TRIS-HCL, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 294.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.27 α = 90
    b = 63.44 β = 101.84
    c = 119.24 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MARRESEARCH
    Collection Date 2000-09-14
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I711
    Wavelength List 1.0292
    Site MAX II
    Beamline I711
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.5
    Resolution(Low) 40
    Number Reflections(All) 22943
    Number Reflections(Observed) 22943
    Percent Possible(Observed) 97.3
    R Merge I(Observed) 0.076
    B(Isotropic) From Wilson Plot 49.8
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.59
    Percent Possible(All) 98.0
    R Merge I(Observed) 0.343
    Mean I Over Sigma(Observed) 3.49
    Redundancy 2.7
    Number Unique Reflections(All) 2293
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 2.5
    Resolution(Low) 39.89
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 22963
    Number of Reflections(Observed) 22963
    Number of Reflections(R-Free) 1142
    Percent Reflections(Observed) 97.3
    R-Work 0.224
    R-Free 0.264
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 57.2
    Anisotropic B[1][1] 2.22
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.16
    Anisotropic B[2][2] 16.18
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -18.4
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.59
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2172
    R-Factor(R-Work) 0.331
    R-Factor(R-Free) 0.364
    R-Free Error 0.035
    Percent Reflections(Observed) 98.2
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 3.73
    c_scbond_it 2.45
    c_mcangle_it 3.05
    c_mcbond_it 1.87
    c_bond_d 0.0078
    c_angle_deg 1.27
     
    Coordinate Error
    Luzzati ESD(Observed) 0.34
    Luzzati Sigma A(Observed) 0.33
    Luzzati Resolution Cutoff(Low) 40.0
    Luzzati ESD(R-Free Set) 0.42
    Luzzati Sigma A(R-Free Set) 0.42
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4197
    Nucleic Acid Atoms 0
    Heterogen Atoms 30
    Solvent Atoms 32
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MARXDS
    Data Reduction (data scaling) XDS
    Structure Solution CNX 2000
    Structure Refinement CNX 2000.1
     
    Software
    refinement CNX version: 2000.1
    model building CNX version: 2000
    data reduction XDS
    data collection MARXDS