X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 294.0
Details CITRIC ACID, TRIS-HCL, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 294.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 92.27 α = 90
b = 63.44 β = 101.84
c = 119.24 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 2000-09-14
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I711 1.0292 MAX_II I711

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 40 97.3 0.076 -- -- 3.2 22943 22943 0.0 -3.0 49.8
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.59 98.0 0.343 -- 3.49 2.7 2293

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 2.5 39.89 -- 0.0 22963 22963 1142 97.3 -- -- 0.224 0.264 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.59 -- 110 2172 0.331 0.364 0.035 98.2
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 57.2
Anisotropic B[1][1] 2.22
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 1.16
Anisotropic B[2][2] 16.18
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -18.4
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.0078
c_mcangle_it 3.05
c_scbond_it 2.45
c_angle_deg 1.27
c_mcbond_it 1.87
c_scangle_it 3.73
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.34
Luzzati Sigma A (Observed) 0.33
Luzzati Resolution Cutoff (Low) 40.0
Luzzati ESD (R-Free Set) 0.42
Luzzati Sigma A (R-Free Set) 0.42
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4241
Nucleic Acid Atoms 0
Heterogen Atoms 30
Solvent Atoms 32

Software

Software
Software Name Purpose
MARXDS data collection
XDS data reduction
CNX refinement version: 2000
MARXDS data reduction
XDS data scaling
CNX phasing version: 2000