X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7.4
Details pH 7.4

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 61.4 α = 115
b = 110.7 β = 97.4
c = 108.7 γ = 90
Symmetry
Space Group P 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 300 mm plate -- 1995-11-02
IMAGE PLATE MAR scanner 180 mm plate -- 1994-03-22
IMAGE PLATE MAR scanner 180 mm plate -- 1994-02-09
Diffraction Radiation
Monochromator Protocol
GRAPHITE (HUBER FLAT MONOCHROMATOR #151) --
GRAPHITE (HUBER FLAT MONOCHROMATOR #151) --
GRAPHITE (HUBER FLAT MONOCHROMATOR #151) --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LURE BEAMLINE DW32 -- LURE DW32
SYNCHROTRON LURE BEAMLINE DW32 -- LURE DW32
ROTATING ANODE SIEMENS -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 12 85.4 0.0956 -- -- 2.7 -- 66471 -- 0.0 69.7
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.7 47.5 0.19 -- 4.0 1.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.6 12.0 -- 3.0 -- 52794 -- 68.0 -- 0.221 0.221 0.297 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.72 -- 56 2105 0.353 0.362 -- 22.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 46.8
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.38
x_bond_d 0.012
x_angle_deg 1.705
x_dihedral_angle_d 24.5
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.4
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 11632
Nucleic Acid Atoms 0
Heterogen Atoms 132
Solvent Atoms 184

Software

Computing
Computing Package Purpose
MARXDS Data Reduction (intensity integration)
MARSCALE Data Reduction (data scaling)
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building