X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Batch
pH 6.7
Temperature 277.0
Details PEG 5000, NaCl, MgCl2, MOPS, ADP, GAR, pH 6.7, batch at 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 62.35 α = 90
b = 179.34 β = 90
c = 75.62 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD SBC-2 -- 2000-07-10
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.7009 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.05 30 93.0 0.066 -- -- 3.6 365075 365075 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.05 1.09 75.5 0.314 -- 1.9 2.3 29388

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 1.05 30.0 -- 0.0 365075 365075 36505 93.0 0.19 0.19 0.188 0.214 RANDOM
RMS Deviations
Key Refinement Restraint Deviation
t_bond_d 0.014
t_angle_deg 2.32
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6029
Nucleic Acid Atoms 0
Heterogen Atoms 135
Solvent Atoms 1040

Software

Software
Software Name Purpose
TNT refinement
d*TREK data reduction
HKL-2000 data scaling
TNT phasing