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X-RAY DIFFRACTION
Materials and Methods page
1KIP
  •   Crystallization Hide
    Crystallization Experiments
    Details FREE TEXT GOES HERE.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 129.23 α = 90
    b = 60.44 β = 119.05
    c = 56.63 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector AREA DETECTOR
    Type SIEMENS
    Collection Date 1994-10-05
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Number Reflections(Observed) 20023
    Percent Possible(Observed) 91.3
    R Merge I(Observed) 0.086
    Redundancy 2.5
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.1
    Resolution(Low) 7.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 15354
    Percent Reflections(Observed) 70.3
    R-Factor(Observed) 0.162
    R-Work 0.162
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.015
    x_angle_deg 1.9
     
    Coordinate Error
    Luzzati ESD(Observed) 0.25
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2724
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 116
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XENGEN
    Data Reduction (data scaling) XENGEN
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1
    data reduction XENGEN
    data collection XENGEN