X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 277.0
Details 30% PEG400, 0.1 M MgCl2, HEPES 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 130.5 α = 90
b = 130.5 β = 90
c = 208.5 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 103
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 1998-05-01
AREA DETECTOR MARRESEARCH -- 1999-12-21
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.08 SSRL BL7-1
SYNCHROTRON ALS BEAMLINE 5.0.2 1.0 ALS 5.0.2
SYNCHROTRON SSRL BEAMLINE BL9-1 0.98 SSRL BL9-1
SYNCHROTRON SSRL BEAMLINE BL9-2 0.96-1.2 SSRL BL9-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 30 99.1 -- 0.031 -- 4.0 51328 50859 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.8 2.9 99.1 -- 0.617 1.6 4.0 50859

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIR 2.8 30.0 1.0 1.0 50859 45998 2542 99.1 0.256 0.256 0.254 0.279 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8 2.9 50859 2542 -- 0.241 0.251 -- 99.1
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 71.1
Anisotropic B[1][1] -4.85
Anisotropic B[1][2] 1.5
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -4.85
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 9.71
RMS Deviations
Key Refinement Restraint Deviation
c_dihedral_angle_d 24.7
c_improper_angle_d 2.33
c_angle_deg 3.0
c_bond_d 0.034
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.67
Luzzati Sigma A (Observed) 0.71
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.63
Luzzati Sigma A (R-Free Set) 0.44
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6033
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 393

Software

Software
Software Name Purpose
XTALVIEW refinement
CNS refinement
DENZO data reduction
SCALEPACK data scaling