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X-RAY DIFFRACTION
Materials and Methods page
1KE9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 22.0
    Details 10% PEG3340, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 22K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.45 α = 90
    b = 73.9 β = 90
    c = 54.1 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS II
    Details mirrors
    Collection Date 1996-07-03
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RU300
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2
    Resolution(Low) 20
    Number Reflections(All) 20373
    Number Reflections(Observed) 19110
    Percent Possible(Observed) 93.8
    R Merge I(Observed) 0.052
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.1
    Percent Possible(All) 91.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 20.0
    Cut-off Sigma(I) 2.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 20373
    Number of Reflections(Observed) 19110
    Number of Reflections(R-Free) 1900
    Percent Reflections(Observed) 93.8
    R-Work 0.203
    R-Free 0.238
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.1
    Number of Reflections(Observed) 2482
    Number of Reflections(R-Free) 238
    R-Factor(R-Work) 0.245
    R-Factor(R-Free) 0.286
    R-Free Error 0.018
    Percent Reflections(Observed) 91.8
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 0.92
    c_dihedral_angle_d 23.0
    c_angle_d 2.0
    c_bond_d 0.011
     
    Coordinate Error
    Luzzati ESD(Observed) 0.22
    Luzzati Sigma A(Observed) 0.21
    Luzzati Resolution Cutoff(Low) 5.0
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2250
    Nucleic Acid Atoms 0
    Heterogen Atoms 25
    Solvent Atoms 110
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution X-PLOR
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR