X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 71.35 α = 90
b = 71.35 β = 90
c = 153.49 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1995-07
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LURE BEAMLINE DW32 -- LURE DW32

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 96.3 0.059 -- -- -- -- 30088 -- 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.0 -- -- 2.0 -- 29606 -- -- -- 0.177 0.177 0.179 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 18.0
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.86
x_bond_d 0.015
x_angle_deg 2.17
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.17
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3441
Nucleic Acid Atoms 0
Heterogen Atoms 96
Solvent Atoms 332

Software

Software
Software Name Purpose
X-PLOR model building
X-PLOR refinement
MOSFLM data reduction
X-PLOR phasing