X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.4
Temperature 25.0
Details LDAO, Potassium phosphate, heptano-1,2,3-triol, dioxane, pH 7.4, VAPOR DIFFUSION, SITTING DROP, temperature 25K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 142.31 α = 90
b = 142.31 β = 90
c = 187.59 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 298
2 298
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 2000-04-15
IMAGE PLATE RIGAKU RAXIS IIC -- 2000-02-20
Diffraction Radiation
Monochromator Protocol
Cylindrically bent triangular Si(111) asymetric cut, horizontal focus monochromator SINGLE WAVELENGTH
Graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.08 SSRL BL7-1
ROTATING ANODE RIGAKU RU200HB 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 30 83.7 0.12 0.121 -- -- -- 59548 0.0 0.0 27.6
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.55 2.69 61.7 0.65 0.65 1.4 1.4 6400

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.5 27.07 -- 2.0 -- 57834 5866 81.4 0.198 0.195 0.195 0.224 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.66 -- 445 3703 0.324 0.343 0.016 33.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 46.7
Anisotropic B[1][1] 0.69
Anisotropic B[1][2] 10.93
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.69
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.37
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 2.65
c_scbond_it 1.65
c_mcangle_it 2.04
c_mcbond_it 1.17
c_improper_angle_d 0.98
c_bond_d 0.009
c_angle_deg 1.6
c_dihedral_angle_d 20.5
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.31
Luzzati Sigma A (Observed) 0.46
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.35
Luzzati Sigma A (R-Free Set) 0.49
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6432
Nucleic Acid Atoms 0
Heterogen Atoms 566
Solvent Atoms 222

Software

Computing
Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
CCP4 (SCALA) Data Reduction (data scaling)
CNS Structure Solution
CNS 1.1 Structure Refinement
Software
Software Name Purpose
CNS version: 1.1 refinement
CNS model building
SCALA data reduction
MOSFLM data collection