X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 292.0
Details PEG4000, SODIUM CHLORIDE, ACETATE , pH 8.50, VAPOR DIFFUSION, HANGING DROP, temperature 292.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 36.34 α = 90
b = 46.94 β = 110.49
c = 42.91 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 MIRROR 2001-10-10
Diffraction Radiation
Monochromator Protocol
SILICON 111 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X9B 0.97946 NSLS X9B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 30 96.3 0.093 -- -- 4.246 19262 19262 0.0 0.0 22.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.55 1.61 92.5 0.51 -- 1.8248 4.012 1843

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.55 30.0 2.0 4.0 18109 13591 944 91.6 0.192 0.16 0.168 0.208 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.55 1.66 1861 -- -- 0.226 -- -- --
X Ray Diffraction 1.66 1.76 1874 -- -- 0.206 -- -- --
X Ray Diffraction 1.76 1.87 1705 -- -- 0.19 -- -- --
X Ray Diffraction 1.87 2.02 1800 -- -- 0.178 -- -- --
X Ray Diffraction 2.02 2.2 1825 -- -- 0.17 -- -- --
X Ray Diffraction 2.2 2.48 1818 -- -- 0.152 -- -- --
X Ray Diffraction 2.48 2.96 1830 -- -- 0.144 -- -- --
X Ray Diffraction 2.96 4.24 1771 -- -- 0.139 -- -- --
X Ray Diffraction 4.24 30.0 904 -- -- 0.205 -- -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model ISOTROPIC
Mean Isotropic B 23.307
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.054
s_similar_adp_cmpnt 0.065
s_rigid_bond_adp_cmpnt 0.0
s_anti_bump_dis_restr 0.028
s_non_zero_chiral_vol 0.06
s_zero_chiral_vol 0.049
s_from_restr_planes 0.027
s_similar_dist 0.0
s_angle_d 0.025
s_bond_d 0.008
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.155
Luzzati Resolution Cutoff (Low) 5.0
Number Disordered Residues 4.0
Occupancy Sum Hydrogen 1170.0
Occupancy Sum Non Hydrogen 1491.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1261
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 230

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
AMORE Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
AMORE model building
SCALEPACK data reduction
DENZO data collection