X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 106.9 α = 90
b = 106.9 β = 90
c = 97 γ = 120
Symmetry
Space Group P 65

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
-- MARRESEARCH -- 1993-02-22
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.08 SSRL BL7-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.64 25 98.2 0.05 -- -- 4.5 -- 75163 -- 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.64 10.0 -- 2.0 -- 73672 -- 96.2 -- 0.176 0.176 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 18.5
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.27
x_bond_d 0.008
x_angle_deg 1.489
x_dihedral_angle_d 26.32
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3530
Nucleic Acid Atoms 0
Heterogen Atoms 9
Solvent Atoms 292

Software

Computing
Computing Package Purpose
MOSFLM V. 5.3 Data Reduction (intensity integration)
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building