X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 295.0
Details ammonium sulfate, magnesium chloride, peg400, hepes, tcep, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 145.05 α = 90
b = 40.36 β = 110.6
c = 77.99 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 monochromator 2001-06-07
IMAGE PLATE RIGAKU RAXIS IIC osmic confocal 2001-07-04
Diffraction Radiation
Monochromator Protocol
double crystal MAD
osmic confocal mirror SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 0.9611, 0.9792, 0.9794 ALS 5.0.2
ROTATING ANODE RIGAKU RU200 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 30 96.8 -- -- -- -- 35366 35366 0.0 0.0 25.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.85 1.92 94.3 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.85 28.27 -- 0.0 34482 34482 3444 94.3 0.184 0.184 0.184 0.211 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.85 1.97 -- 526 4732 0.236 0.287 0.013 87.2
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 28.1
Anisotropic B[1][1] -4.09
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.08
Anisotropic B[2][2] 5.58
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.49
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.006
c_mcangle_it 2.43
c_improper_angle_d 1.65
c_mcbond_it 1.69
c_angle_deg 1.3
c_scangle_it 3.6
c_dihedral_angle_d 23.6
c_scbond_it 2.52
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.19
Luzzati Sigma A (Observed) 0.14
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.22
Luzzati Sigma A (R-Free Set) 0.18
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2339
Nucleic Acid Atoms 466
Heterogen Atoms 50
Solvent Atoms 259

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
CNS Structure Solution
CNS 1.0 Structure Refinement
Software
Software Name Purpose
CNS model building
CNS version: 1.0 refinement