X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
pH 5.8
Details PEG4k, Am. Acetate, Na-Citrate, pH 5.8, VAPOR DIFFUSION

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 78.18 α = 90
b = 78.18 β = 90
c = 80.4 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD CUSTOM-MADE Double-crystal monochromator, mirror 2001-09-10
CCD CUSTOM-MADE Double-crystal monochromator, mirror 2001-08-21
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
SAGITALLY FOCUSED Si(111) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.03321 APS 19-ID
SYNCHROTRON APS BEAMLINE 19-ID 0.97937, 0.97918 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.45 60 99.3 -- 0.06 -- 8.8 40104 40104 -- 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.45 1.5 93.8 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.5 55.09 -- 0.0 -- 35524 1875 92.68 -- 0.21261 0.21135 0.23751 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5 1.539 2958 127 -- 0.25 0.29 -- --
X Ray Diffraction 1.539 1.581 2859 115 -- 0.229 0.257 -- --
X Ray Diffraction 1.581 1.627 2814 123 -- 0.224 0.231 -- --
X Ray Diffraction 1.627 1.677 2698 103 -- 0.215 0.248 -- --
X Ray Diffraction 1.677 1.732 2638 121 -- 0.218 0.269 -- --
X Ray Diffraction 1.732 1.793 2540 128 -- 0.223 0.262 -- --
X Ray Diffraction 1.793 1.86 2463 99 -- 0.223 0.269 -- --
X Ray Diffraction 1.86 1.936 2376 124 -- 0.22 0.264 -- --
X Ray Diffraction 1.936 2.022 2285 113 -- 0.215 0.303 -- --
X Ray Diffraction 2.022 2.121 2210 130 -- 0.219 0.303 -- --
X Ray Diffraction 2.121 2.235 2086 102 -- 0.224 0.24 -- --
X Ray Diffraction 2.235 2.37 1978 106 -- 0.213 0.222 -- --
X Ray Diffraction 2.37 2.534 1870 90 -- 0.225 0.202 -- --
X Ray Diffraction 2.534 2.736 1751 87 -- 0.219 0.244 -- --
X Ray Diffraction 2.736 2.997 1613 76 -- 0.22 0.278 -- --
X Ray Diffraction 2.997 3.349 1482 80 -- 0.229 0.23 -- --
X Ray Diffraction 3.349 3.865 1310 66 -- 0.204 0.202 -- --
X Ray Diffraction 3.865 4.728 1131 52 -- 0.179 0.169 -- --
X Ray Diffraction 4.728 6.663 897 36 -- 0.238 0.23 -- --
X Ray Diffraction 6.663 55.902 550 18 -- 0.25 0.33 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 16.815
Anisotropic B[1][1] -0.74
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.74
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.47
RMS Deviations
Key Refinement Restraint Deviation
p_scangle_it 2.895
p_scbond_it 2.125
p_mcangle_it 1.176
p_mcbond_it 0.767
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1519
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 252

Software

Computing
Computing Package Purpose
D*TREK, HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
CNS Structure Solution
REFMAC 5 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.0 refinement
CNS model building