X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.8
Temperature 298.0
Details PEG 6K, EDTA, Tris, pH 7.8, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Method Vapor Diffusion Hanging Drop
pH 5.1
Temperature 298.0
Details PEG 6K, phosphate citrate buffer, pH 5.1, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 46.22 α = 90
b = 59.24 β = 109.8
c = 51.31 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
2 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
-- -- -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX9.6 0.87 SRS PX9.6
SYNCHROTRON SRS BEAMLINE PX9.6 0.87 SRS PX9.6

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.14 39.5 85.2 -- -- -- -- 80691 80508 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.14 1.15 72.7 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.14 10.0 -- 0.0 76489 80628 4019 80.9 0.11 0.1065 0.1093 0.1458 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.14 1.15 -- -- -- 0.097 -- -- 79.9
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.054
s_similar_adp_cmpnt 0.048
s_rigid_bond_adp_cmpnt 0.005
s_anti_bump_dis_restr 0.042
s_non_zero_chiral_vol 0.091
s_zero_chiral_vol 0.085
s_from_restr_planes 0.029
s_similar_dist 0.0
s_angle_d 0.028
s_bond_d 0.014
Coordinate Error
Parameter Value
Number Disordered Residues 17.0
Occupancy Sum Hydrogen 2089.0
Occupancy Sum Non Hydrogen 2518.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2311
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 199

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
SHELX Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
SHELX model building
SCALEPACK data reduction
DENZO data collection