X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 288.0
Details 1.8M Ammonium-Sulfate, 0.1M Sodium-citrate pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 288K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 76.5 α = 90
b = 76.5 β = 90
c = 164.31 γ = 90
Symmetry
Space Group P 43 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD BRANDEIS - B4 -- 2001-05-29
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 -- NSLS X25

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.25 40 97.4 -- 0.06 -- 7.5 -- 131559 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.25 1.27 91.0 -- 0.34 -- 7.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
AB INITIO PHASING 1.25 10.0 -- 0.0 120771 120771 6452 97.4 -- -- 0.1491 0.1807 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.25 1.27 -- 6452 -- 0.1491 0.1807 -- --
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.104
s_similar_adp_cmpnt 0.059
s_rigid_bond_adp_cmpnt 0.005
s_anti_bump_dis_restr 0.027
s_non_zero_chiral_vol 0.097
s_zero_chiral_vol 0.1
s_from_restr_planes 0.0271
s_similar_dist 0.0
s_angle_d 0.04
s_bond_d 0.016
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.06
Number Disordered Residues 8.0
Occupancy Sum Hydrogen 0.0
Occupancy Sum Non Hydrogen 2941.52
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2023
Nucleic Acid Atoms 401
Heterogen Atoms 50
Solvent Atoms 488

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
SHELX Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
SHELX model building
SCALEPACK data reduction
DENZO data collection