X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Batch Method
pH 7.35
Temperature 310.0
Details potassium phosphate 1.75M, pH 7.35, batch method, temperature 310K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.16 α = 90
b = 54.16 β = 90
c = 195.3 γ = 90
Symmetry
Space Group P 41 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 298
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS X1000 -- 1995-03-08
Diffraction Radiation
Monochromator Protocol
graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 22.55 94.0 0.063 -- -- 4.38 19382 19382 0.0 0.0 24.9
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.09 85.16 -- -- -- -- 2135

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.0 22.55 0.0 0.0 19382 19382 1906 89.14 -- -- 0.183 0.238 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.09 2135 212 -- 0.249 0.2873 -- 85.16
X Ray Diffraction 2.09 2.2 2252 195 -- 0.2304 0.2399 -- 90.12
X Ray Diffraction 2.2 2.34 2348 255 -- 0.218 0.2514 -- 92.7
X Ray Diffraction 2.34 2.52 2378 240 -- 0.2054 0.239 -- 94.55
X Ray Diffraction 2.52 2.77 2452 228 -- 0.2015 0.2499 -- 95.93
X Ray Diffraction 2.77 3.17 2511 242 -- 0.1865 0.2607 -- 96.8
X Ray Diffraction 3.17 4.0 2561 263 -- 0.1501 0.2153 -- 98.09
X Ray Diffraction 4.0 22.55 2745 271 -- 0.1581 0.2222 -- 97.76
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Isotropic
Mean Isotropic B 24.9
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 6.803
x_scbond_it 5.056
x_mcangle_it 4.076
x_mcbond_it 3.274
x_improper_angle_d 0.898
x_dihedral_angle_d 21.82
x_angle_deg 1.123
x_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2192
Nucleic Acid Atoms 0
Heterogen Atoms 90
Solvent Atoms 113

Software

Computing
Computing Package Purpose
RIGAKU Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
X-PLOR Structure Solution
X-PLOR 3.851 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.851 refinement
X-PLOR model building
XDS data reduction
RIGAKU data collection