X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.8
Temperature 278.0
Details 50% saturated Cesium Sulfate, pH 4.8, VAPOR DIFFUSION, HANGING DROP, temperature 278K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 86.79 α = 90
b = 86.79 β = 90
c = 116.32 γ = 120
Symmetry
Space Group P 61 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 93
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV Osmic Mirrors 2000-09-07
Diffraction Radiation
Monochromator Protocol
Osmic Mirrors SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200H 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 20 84.8 0.1067 0.1067 -- 31.74 26828 22762 0.0 -3.0 20.094
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.75 1.81 40.0 0.3302 0.3302 8.51 8.02 4354

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
AB INITIO 1.76 20.0 -3.0 0.0 39979 39979 2117 84.8 -- -- 0.1641 0.1938 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.75 1.88 4074 -- -- 0.229 -- -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Isotropic
Mean Isotropic B 24.0
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.0
s_similar_adp_cmpnt 0.076
s_rigid_bond_adp_cmpnt 0.0
s_anti_bump_dis_restr 0.013
s_non_zero_chiral_vol 0.084
s_zero_chiral_vol 0.059
s_from_restr_planes 0.0306
s_similar_dist 0.0
s_angle_d 0.032
s_bond_d 0.012
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.015
Number Disordered Residues 8.0
Occupancy Sum Hydrogen 0.0
Occupancy Sum Non Hydrogen 1330.07
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1089
Nucleic Acid Atoms 0
Heterogen Atoms 24
Solvent Atoms 234

Software

Computing
Computing Package Purpose
R-AXIS Data Reduction (intensity integration)
XENGEN Data Reduction (data scaling)
ARP/WARP Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
ARP/WARP model building