X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Microbatch
pH 7.5
Temperature 296.0
Details 2.1-2.3M Phosphate buffer, pH 7.5, Microbatch, temperature 296K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 93.11 α = 90
b = 43.97 β = 122.01
c = 83.44 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 296
2 296
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IIC yale mirrors 2000-02-16
IMAGE PLATE RIGAKU RAXIS IIC yale mirrors 2000-02-14
Diffraction Radiation
Monochromator Protocol
Yale Mirrors SINGLE WAVELENGTH
Yale Mirrors SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.5418 -- --
ROTATING ANODE RIGAKU RU200 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 40 88.1 0.066 -- -- 3.0 46282 40783 1.0 1.0 20.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.5 1.55 39.9 0.235 -- -- -- 1842

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.5 28.62 -- 0.0 40765 40765 4098 88.3 0.217 0.215 0.215 0.236 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5 1.55 1889 173 1716 0.291 0.318 0.022 41.2
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 17.9
Anisotropic B[1][1] 0.65
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -0.09
Anisotropic B[2][2] 1.5
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.15
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.1
c_scangle_it 0.22
c_improper_angle_d 1.12
c_dihedral_angle_d 19.0
c_mcbond_it 0.72
c_bond_d 0.007
c_mcangle_it 1.12
c_scbond_it 0.13
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.2
Luzzati Sigma A (Observed) 0.15
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.22
Luzzati Sigma A (R-Free Set) 0.14
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2240
Nucleic Acid Atoms 0
Heterogen Atoms 90
Solvent Atoms 165

Software

Software
Software Name Purpose
CNS refinement
DENZO data reduction
SCALEPACK data scaling
CNS phasing