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X-RAY DIFFRACTION
Materials and Methods page
1JXP
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details pH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 96.96 α = 90
    b = 96.96 β = 90
    c = 167.1 γ = 120
     
    Space Group
    Space Group Name:    P 63 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 113
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS II
    Details DOUBLE MIRRORS
    Collection Date 1996-11
     
    Diffraction Radiation
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH2R
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.2
    Resolution(Low) 30
    Number Reflections(Observed) 22953
    Percent Possible(Observed) 94.0
    R Merge I(Observed) 0.082
    Redundancy 15.0
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.28
    Percent Possible(All) 72.0
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.2
    R-Factor(Observed) 0.245
    R-Work 0.245
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.013
    x_angle_deg 2.3
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2770
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 215
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) SCALEPACK
    Structure Solution X-PLOR
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building X-PLOR