X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 298.0
Details 28 % PEG MME 5000, 0.2 M Ammonium sulfate, 0.1 M MES buffer, pH 6.5, VAPOR DIFFUSION, HANGING DROP at 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 98.37 α = 90
b = 112.17 β = 90
c = 116.68 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH Si(111) double-crystal 2001-11-05
CCD ADSC QUANTUM 4 bent cylindrical Si-mirror (Rh coating), Si(111) double-crystal 2001-11-17
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-BM-D 0.9796, 0.9795, 0.9537 APS 14-BM-D
SYNCHROTRON APS BEAMLINE 17-ID 1.000 APS 17-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 100 100.0 0.067 -- -- 14.3 -- 73741 -- 2.0 21.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.18 99.9 0.39 -- 2.0 13.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.1 75.21 -- 0.0 73662 73662 3686 97.6 -- 0.224 0.224 0.242 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1 2.23 -- 497 9720 0.28 0.305 0.014 --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 31.1
Anisotropic B[1][1] 3.96
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -5.22
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.26
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.01
c_scangle_it 2.87
c_mcangle_it 1.91
c_improper_angle_d 1.0
c_mcbond_it 1.2
c_dihedral_angle_d 24.2
c_scbond_it 1.92
c_angle_deg 1.4
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.27
Luzzati Sigma A (Observed) 0.21
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.3
Luzzati Sigma A (R-Free Set) 0.25
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8370
Nucleic Acid Atoms 0
Heterogen Atoms 36
Solvent Atoms 412

Software

Software
Software Name Purpose
SOLVE phasing
CNS refinement version: 1.0
DENZO data reduction
SCALEPACK data scaling