X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 80.4 α = 90
b = 80.4 β = 90
c = 158.41 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS-NICOLET X100 -- 1996-07-04
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 99.0 0.094 -- -- 6.0 -- 22503 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.5 5.0 -- -- -- 15536 -- -- -- 0.195 0.195 0.25 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 22.0
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.012
x_improper_angle_d 1.42
x_angle_deg 1.86
x_dihedral_angle_d 24.9
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.3
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4067
Nucleic Acid Atoms 0
Heterogen Atoms 84
Solvent Atoms 699

Software

Software
Software Name Purpose
X-PLOR model building version: 3.1
X-PLOR refinement version: 3.1
XENGEN data reduction
XENGEN data scaling
X-PLOR phasing version: 3.1