X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 293.0
Details Sodium/Potassium phosphate, Lithium Sulfate, CAPS, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 123.64 α = 90
b = 131.35 β = 90
c = 108.14 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 95
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2001-06-03
IMAGE PLATE RIGAKU RAXIS IV mirrors 2001-06-23
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) MAD
Graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.5418 -- --
SYNCHROTRON NSLS BEAMLINE X9B 0.97900,0.97946,0.96859 NSLS X9B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 100 97.6 0.051 -- -- 3.57 -- 43908 2.0 -- 28.5
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.28 86.7 0.282 -- 3.97 2.8 3823

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD/FOURIER SYNTHESIS 2.2 90.03 -- 0.0 -- 42356 4269 94.2 -- -- 0.221 0.254 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2 2.34 -- 597 5439 0.255 0.284 0.012 81.7
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 45.9
Anisotropic B[1][1] -5.89
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 13.22
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -7.33
RMS Deviations
Key Refinement Restraint Deviation
c_mcbond_it 1.44
c_scbond_it 2.34
c_improper_angle_d 0.79
c_scangle_it 3.46
c_angle_deg 1.2
c_dihedral_angle_d 18.7
c_bond_d 0.006
c_mcangle_it 2.31
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.27
Luzzati Sigma A (Observed) 0.2
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.33
Luzzati Sigma A (R-Free Set) 0.23
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5214
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 175

Software

Software
Software Name Purpose
SOLVE phasing
CNS refinement version: 1.0
DENZO data reduction
SCALEPACK data scaling