X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6
Temperature 293.15
Details 18% PEG MME5000, 0.2M ammonium sulfate, 0.1M HEPES 7.0, 0.010MM Zn chloride, 0.0108MM D-CAPTOPRIL, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 82.12 α = 90
b = 76.78 β = 110.21
c = 44.84 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD -- -- 2001-04-29
IMAGE PLATE MARRESEARCH mirrors 2001-04-02
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
-- SAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ENRAF-NONIUS FR591 1.5418 -- --
SYNCHROTRON ESRF BEAMLINE BM30A 1.282760 ESRF BM30A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.78 42.26 92.4 0.045 0.038 -- 3.2 49235 45143 -- 3.0 12.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.78 1.88 61.0 0.097 0.076 8.4 1.8 2221

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.78 38.08 -- 0.0 24162 23107 4472 91.7 -- -- 0.161 0.19 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.78 1.89 2312 248 -- 0.184 0.215 0.014 61.9
X Ray Diffraction 2.09 2.11 869 94 -- 0.1626 0.1782 -- --
X Ray Diffraction 2.55 2.6 867 96 -- 0.1719 0.2181 -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model restrained
Mean Isotropic B 13.4
Anisotropic B[1][1] 1.76
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.28
Anisotropic B[2][2] 1.15
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.91
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.9
c_dihedral_angle_d 24.9
c_scangle_it 0.87
c_mcbond_it 0.41
c_scbond_it 0.57
c_bond_d 0.02
c_improper_angle_d 1.26
c_mcangle_it 0.7
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.16
Luzzati Sigma A (Observed) 0.06
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.19
Luzzati Sigma A (R-Free Set) 0.11
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2056
Nucleic Acid Atoms 0
Heterogen Atoms 43
Solvent Atoms 255

Software

Software
Software Name Purpose
DENZO data reduction
SCALA data scaling
AMoRE phasing
CNS refinement
CCP4 data scaling version: (SCALA)