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X-RAY DIFFRACTION
Materials and Methods page
1JSU
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.8 α = 90
    b = 78.3 β = 90
    c = 137.2 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU
    Collection Date 1996-02-20
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Number Reflections(Observed) 162339
    Percent Possible(Observed) 96.1
    R Merge I(Observed) 0.056
    Redundancy 4.7
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.3
    Resolution(Low) 7.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 31351
    Percent Reflections(Observed) 96.1
    R-Work 0.192
    R-Free 0.26
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    t_it 3.6
    t_angle_deg 1.45
    t_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4980
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 197
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Structure Refinement TNT
     
    Software
    refinement TNT