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X-RAY DIFFRACTION
Materials and Methods page
1JRS
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion - hanging drop
    Details ORTHORHOMBIC SPACE GROUP; CRYSTALLIZATION CONDITIONS: 24-26% PEG8000, 0.02M INHIBITOR, 0.2M (NH4)2 SO4, 50MM TRIS-HCL, ROOM TEMPERATURE, HANGING DROP., vapor diffusion - hanging drop
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.69 α = 90
    b = 69.37 β = 90
    c = 63.01 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU
    Collection Date 1994-03-19
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Number Reflections(Observed) 78707
    Percent Possible(Observed) 88.8
    R Merge I(Observed) 0.044
    Redundancy 3.24
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.8
    Resolution(Low) 8.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 23223
    R-Factor(Observed) 0.175
    R-Work 0.175
    R-Free 0.207
     
    Temperature Factor Modeling
    Mean Isotropic B Value 22.2
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.013
    x_angle_deg 2.6
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1659
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 170
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) PROCESS
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1
    data collection PROCESS