X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 298.0
Details 28-30% PEG4000, 100mM Tris pH 8.0, 10mM CaCl2, + 1.5% heptane-1,2,3-triol added to drop, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 30.57 α = 90
b = 51.94 β = 102.19
c = 59.1 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH PT/PD-COATED ULE MIRROR 2001-03-10
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-BM 0.91840 APS 17-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.37 25.9 99.9 0.0308 -- -- 6.47 38052 38052 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.37 1.4 100.0 0.2705 -- 3.06 3.63 2391

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD (PT & BR) 1.37 25.9 -3.0 -- 38052 38052 3072 99.9 -- -- 0.1379 0.2214 RANDOM
RMS Deviations
Key Refinement Restraint Deviation
s_approx_iso_adps 0.093
s_similar_adp_cmpnt 0.069
s_rigid_bond_adp_cmpnt 0.004
s_anti_bump_dis_restr 0.013
s_non_zero_chiral_vol 0.065
s_zero_chiral_vol 0.058
s_from_restr_planes 0.0281
s_similar_dist 0.0
s_angle_d 0.03
s_bond_d 0.011
Coordinate Error
Parameter Value
Number Disordered Residues 14.0
Occupancy Sum Hydrogen 1525.0
Occupancy Sum Non Hydrogen 1771.5
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1489
Nucleic Acid Atoms 0
Heterogen Atoms 42
Solvent Atoms 264

Software

Computing
Computing Package Purpose
HKL V. 1.96.1 Data Reduction (intensity integration)
XPREP V. 6.09 Data Reduction (data scaling)
SOLVE, RESOLVE, CNS, SHELX Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
SHELX model building
CNS model building
RESOLVE model building
SOLVE model building
XPREP version: 6.09 data reduction
HKL version: 1.96.1 data collection