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X-RAY DIFFRACTION
Materials and Methods page
1JIR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 295.0
    Details ammonium sulfate, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.7 α = 90
    b = 63.5 β = 90
    c = 69.07 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 295
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IIC
    Collection Date 1998-01-01
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RU300
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(All) 16878
    Number Reflections(Observed) 16878
    Percent Possible(Observed) 87.6
    R Merge I(Observed) 0.071
    B(Isotropic) From Wilson Plot 23.5
    Redundancy 4.4
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.1
    Percent Possible(All) 77.1
    Mean I Over Sigma(Observed) 2.0
    Number Unique Reflections(All) 1988
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 50.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 16878
    Number of Reflections(Observed) 14328
    Number of Reflections(R-Free) 1424
    R-Factor(All) 0.198
    R-Factor(Observed) 0.182
    R-Work 0.169
    R-Free 0.21
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.09
    Number of Reflections(Observed) 1017
    Number of Reflections(R-Free) 105
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.308
    Percent Reflections(Observed) 43.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.09
    Shell Resolution(Low) 2.2
    Number of Reflections(Observed) 1316
    Number of Reflections(R-Free) 128
    R-Factor(R-Work) 0.179
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 55.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.34
    Number of Reflections(Observed) 1520
    Number of Reflections(R-Free) 166
    R-Factor(R-Work) 0.18
    R-Factor(R-Free) 0.239
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.34
    Shell Resolution(Low) 2.52
    Number of Reflections(Observed) 1721
    Number of Reflections(R-Free) 154
    R-Factor(R-Work) 0.18
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 72.7
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.52
    Shell Resolution(Low) 2.77
    Number of Reflections(Observed) 1923
    Number of Reflections(R-Free) 221
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.238
    Percent Reflections(Observed) 80.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.77
    Shell Resolution(Low) 3.17
    Number of Reflections(Observed) 2105
    Number of Reflections(R-Free) 184
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.232
    Percent Reflections(Observed) 92.5
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_deg 1.15
    x_dihedral_angle_deg 25.69
    x_angle_deg 1.31
    x_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1629
    Nucleic Acid Atoms 0
    Heterogen Atoms 33
    Solvent Atoms 133
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) R-AXIS
    Data Reduction (data scaling) R-AXIS
    Structure Solution X-PLOR
    Structure Refinement X-PLOR 3.843
     
    Software
    refinement X-PLOR version: 3.843
    model building X-PLOR
    data reduction R-AXIS
    data collection R-AXIS