X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6
Temperature 295.0
Details ammonium sulfate, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 62.7 α = 90
b = 63.5 β = 90
c = 69.07 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 295
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IIC -- 1998-01-01
Diffraction Radiation
Monochromator Protocol
GRAPHITE SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU300 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 50 87.6 0.071 -- -- 4.4 16878 16878 0.0 0.0 23.5
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.1 77.1 -- -- 2.0 -- 1988

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.0 50.0 -- 2.0 16878 14328 1424 -- 0.198 0.182 0.169 0.21 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.09 1017 105 -- 0.183 0.308 -- 43.0
X Ray Diffraction 2.09 2.2 1316 128 -- 0.179 0.264 -- 55.9
X Ray Diffraction 2.2 2.34 1520 166 -- 0.18 0.239 -- 64.0
X Ray Diffraction 2.34 2.52 1721 154 -- 0.18 0.237 -- 72.7
X Ray Diffraction 2.52 2.77 1923 221 -- 0.184 0.238 -- 80.6
X Ray Diffraction 2.77 3.17 2105 184 -- 0.182 0.232 -- 92.5
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_deg 1.15
x_dihedral_angle_deg 25.69
x_angle_deg 1.31
x_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1629
Nucleic Acid Atoms 0
Heterogen Atoms 33
Solvent Atoms 133

Software

Computing
Computing Package Purpose
R-AXIS Data Reduction (intensity integration)
R-AXIS Data Reduction (data scaling)
X-PLOR Structure Solution
X-PLOR 3.843 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.843 refinement
X-PLOR model building
R-AXIS data reduction
R-AXIS data collection