X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 298.0
Details Potasium phosphate, LDAO, heptane triol, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 141.68 α = 90
b = 141.68 β = 90
c = 186.84 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 298
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH 58 cm long, Pt-coated, fused silica, vertical focusmirror 2000-04-11
Diffraction Radiation
Monochromator Protocol
Cyclindrically bent triangular Si(111) asymmetric cut, horizontal focus monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.08 SSRL BL7-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 30 59.5 0.103 -- -- -- 35678 35678 0.0 0.0 36.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.8 38.05 0.21 -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.7 29.1 0.0 2.0 60002 37579 3781 62.6 -- -- 0.218 0.257 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7 2.87 -- 517 4410 0.346 0.375 0.017 50.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 49.1
Anisotropic B[1][1] 2.46
Anisotropic B[1][2] 1.91
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.46
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -4.92
RMS Deviations
Key Refinement Restraint Deviation
c_scbond_it 1.41
c_bond_d 0.008
c_scangle_it 2.25
c_dihedral_angle_d 19.3
c_mcangle_it 1.95
c_angle_deg 1.3
c_improper_angle_d 0.92
c_mcbond_it 1.12
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.43
Luzzati Sigma A (Observed) 0.72
Luzzati Resolution Cutoff (Low) 3.0
Luzzati ESD (R-Free Set) 0.48
Luzzati Sigma A (R-Free Set) 0.55
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6468
Nucleic Acid Atoms 0
Heterogen Atoms 566
Solvent Atoms 89

Software

Software
Software Name Purpose
CNS refinement
MOSFLM data reduction
CCP4 data scaling version: (SCALA)
CNS phasing