X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 298.0
Details Potasium phosphate, LDAO, heptane triol, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 142.11 α = 90
b = 142.11 β = 90
c = 187.74 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 298
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH 58 cm long, Pt-coated, fused silica, vertical focusmirror 2000-04-13
Diffraction Radiation
Monochromator Protocol
Cyclindrically bent triangular Si(111) asymmetric cut, horizontal focus monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.08 SSRL BL7-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 30 88.8 0.143 -- -- -- 39407 39407 0.0 0.0 77.9
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.0 3.11 51.33 0.266 -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.01 29.97 0.0 2.0 44373 40732 4095 92.5 -- -- 0.211 0.249 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.0 3.19 -- 535 4338 0.326 0.361 0.016 66.8
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 50.6
Anisotropic B[1][1] 1.93
Anisotropic B[1][2] 7.4
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.93
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -3.86
RMS Deviations
Key Refinement Restraint Deviation
c_dihedral_angle_d 19.7
c_bond_d 0.009
c_scangle_it 2.71
c_angle_deg 1.6
c_scbond_it 1.63
c_mcbond_it 1.46
c_improper_angle_d 0.99
c_mcangle_it 2.1
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.45
Luzzati Sigma A (Observed) 0.1
Luzzati Resolution Cutoff (Low) 3.1
Luzzati ESD (R-Free Set) 0.46
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6470
Nucleic Acid Atoms 0
Heterogen Atoms 485
Solvent Atoms 112

Software

Software
Software Name Purpose
CNS refinement
MOSFLM data reduction
SCALEPACK data scaling
CNS phasing