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X-RAY DIFFRACTION
Materials and Methods page
1JGP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 7.4
    Temperature 237.0
    Details 20 mM MgCl2, 100 mM KCl, 20 mM tris HCl, pH 7.4, VAPOR DIFFUSION at 237K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 507.2 α = 90
    b = 507.2 β = 90
    c = 803.66 γ = 90
     
    Space Group
    Space Group Name:    I 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 4
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 5.0.2
    Wavelength 1.100
    Site ALS
    Beamline 5.0.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 7
    Resolution(Low) 250
    Number Reflections(Observed) 73146
    Percent Possible(Observed) 89.5
    Redundancy 3.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 7.0
    Resolution(Low) 250.0
    Cut-off Sigma(I) 0.0
    Number of Reflections(all) 73146
    Number of Reflections(Observed) 73146
    Percent Reflections(Observed) 89.5
     
    Temperature Factor Modeling
    Data Not Available
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2396
    Nucleic Acid Atoms 6539
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution CCP4
    Structure Refinement O
     
    Software
    refinement O
    model building CCP4