X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 298.0
Details PEG 6000, potassium phosphate, pH 7, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 29.7 α = 90
b = 59.9 β = 90
c = 65.4 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 298
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IIC -- 1999-10-12
IMAGE PLATE RIGAKU RAXIS IIC -- 1999-10-15
IMAGE PLATE RIGAKU RAXIS IIC -- 1999-10-10
Diffraction Radiation
Monochromator Protocol
graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200HB 1.5418 -- --
ROTATING ANODE RIGAKU RU200BH 1.5418 -- --
ROTATING ANODE RIGAKU RU200BH 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 20 98.6 0.07 -- -- 16.9 13248 13248 2.0 0.0 21.9
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.7 20.0 88.4 0.32 -- 149.0 10.0 1169

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD, MIR,MOLECULAR REPLACEMENT 1.7 20.0 0.0 2.0 13248 12801 1079 95.4 -- -- 0.19 0.21 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.76 907 81 -- 0.2661 0.2626 -- 88.4
X Ray Diffraction 1.76 1.83 1039 122 -- 0.2391 0.2539 -- 97.9
X Ray Diffraction 1.83 1.91 1117 139 -- 0.1955 0.1812 -- 100.0
X Ray Diffraction 1.91 2.02 1154 135 -- 0.2002 0.2201 -- 100.0
X Ray Diffraction 2.02 2.14 1174 124 -- 0.1957 0.1886 -- 100.0
X Ray Diffraction 2.14 2.31 1196 132 -- 0.2093 0.2104 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 25.2
Anisotropic B[1][1] -0.5
Anisotropic B[1][2] -0.05
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.0
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.0
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.3
c_dihedral_angle_d 21.4
c_bond_d 0.006
c_improper_angle_d 1.47
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.2
Luzzati Sigma A (Observed) 0.08
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.19
Luzzati Sigma A (R-Free Set) 0.11
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 892
Nucleic Acid Atoms 0
Heterogen Atoms 43
Solvent Atoms 87

Software

Software
Software Name Purpose
CNS refinement
DENZO data reduction
SCALEPACK data scaling
CNS phasing